Leveraging a high-performance layout computing engine and a robust ecosystem of layout analysis tools, LayoutInsight can quantify the distribution of different devices from the chip layout and extract device feature parameters, attributes related to layout-dependent effect (LDE), and critical geometric parameters of hotspot patterns. Like the genetic map of a chip, the extracted data allows users to gain insights into the characteristics of chip devices and process hotspots from different perspectives, which helps users identify yield issues, shorten the yield enhancement cycle, and optimize design quality.