1.Segmented Measurement: Divide outlines via horizontal/vertical tangents and compute segment averaged values efficiently.

2.Serial Measurement: Carry out metrology with defined physical offsets against baselines.

3.Angle Measurement: Characterize tilt angles, included angles and orientation related parameters.

4.Free form Area Calculation: Sketch arbitrary regions to compute irregular area metrics rapidly.

1.Smart Edge Detection: Compatible with diverse device profiles and images with different noise levels.

2.Smoothness Tuning: Preserve valid details while filtering out noise interference.

3.Critical Point Capture: Auto detect vertices and curvature sensitive positions.

4.Adaptive Parameter Suggestion: Reduce manual tuning efforts for outline extraction.

1.Save typical device samples and preset metrology rules to formalize engineers鈥 know how into reusable recipes.

2. Recognize matching structures in new images and auto apply pre-defined measurement rules.

1.Manually trace contours to supplement indistinct edges.

2.Leverage grayscale analysis to pinpoint boundary variations and support pixel level edits.