Semitronix Releases the New Generation of T4000 Series: A High-Performance Semiconductor Parametric Testing System for General Purpose

Recently, Semitronix officially launched a new generation of our general utilility, high-performance semiconductor parametric testing system (T4000), which serves as a valuable complement to our existing volume production highly parallel tester (T4100S). The T4000 series is designed to meet the diverse usage needs of our customers. The launch of T4000 further expands our product line and signifies a significant breakthrough in the field of wafer-level electrical testing equipment.

T4000 covers  a wide range of process technologies, including LOGIC, CIS, DRAM, SRAM, FLASH, BCD. Additionally, it supports parametric testing for compound semiconductors such as SiC and GaN. This system offers a rich library of algorithms for WAT and WLR testing while supporting various mainstream WAT probe cards and major probe stations worldwide. The system efficiently handles testing for all standard WAT parameters, WLR parameters, as well as addressable test chips. It finds extensive applications in fields such as WAT, WLR, and SPICE.

Compared to similar equipment in the market, T4000 series significantly reduces the testing time required per wafer, with throughput improvements ranging from 20% to 200%. It is highly cost-effective and particularly suitable for cost conscious production lines (8 inch and below wafer fabs). With its extensive features, high stability, and excellent compatibility, T4000 series is not only suitable for new production lines but also serves as an effective replacement for old tester equipment in existing fabs.

Advantages of T4000 Series

Semitronix has developed a proprietary general utility, high-performance semiconductor parametric testing system (T4000 series) that incorporates a new generation of ultra-low leakage expandable matrix switches. It is characterized by high precision, fast speed, and flexible configuration. The system can support up to 100 pins, enabling parallel testing with multiple modules. Thanks to its advanced structural design and comprehensive self-checking and self-calibration functions, the system exhibits improved stability and consistency. T4000 series also offers three main models to cater to different needs and usage scenarios, providing customers with customized options for selection.

Since the research and development efforts began in 2010, Semitronix has been committed to developing and providing technologically advanced semiconductor parametric testing systems with international competitiveness. Semitronix has been supplying WAT testing equipment to major integrated circuit production lines globally.

After long-term validation on over hundreds of chip products across more than 20 customer production lines, Semitronix’s WAT testers have demonstrated superior qualities such as reliable quality, comprehensive functionality, strong consistency, high measurement accuracy, fast testing efficiency, short delivery cycles, and excellent customer support.The introduction of T4000 series is expected to inject new momentum into the Semitronix’s business expansion.

Semitronix will continue to develop more technologically innovative and differentiated products with international competitiveness. Semitronix aims to provide customers and the market with solutions that offer superior performance, high production efficiency, and excellent cost-effectiveness. By doing so, Semitronix strives to create greater value for customers.